Wednesday, October 19, 2016, 10:00am – 11:30am

Speaker: Tom Bergman, Battelle

Battelle has been developing and testing a technology to nondestructively classify electronic components as authentic or counterfeit. Currently, alternative effective detection methods require exhaustive testing of all component functionality, destructive analysis of test devices, or use of a specialized imaging technique. The Barricade technology developed at Battelle does not require integrated circuit design modifications, physical alterations to existing inventory, or any changes to electronic component manufacturing processes to perform the classification process. The technology uses a method that differentiates classes of devices from data acquired from their power consumption waveforms. The Barricade system is based on the concept of side channel power analysis, a technique that involves collecting unintentional or side channel emissions from a device. The collected data files are loaded into the Barricade classifier algorithm that performs the electronic component classification. Battelle will be presenting details on the continued development of this system, including presenting new data collected on authentic, counterfeit, and cloned components.